Semiconductor
Applied to microwave anechoic chambers for adjusting the position of test antennas on communication‑module products such as 5G modules, smartphones, iPads, and wearable devices.
1. The test antenna can be adjusted in multiple degrees of freedom to suit the specific application scenario.
2. Each axis is equipped with a positioning scale, ensuring high repeatability and reliability, and features a modular design for flexible configuration.
3. The scan frame is constructed entirely from non-metallic materials to prevent test interference caused by signal reflections during testing.
4. The scanner frame is designed with thorough consideration for electrostatic discharge protection.
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