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Microwave device three-temperature sorting test equipment
The equipment is mainly aimed at the production, research and development of small batch and measurement certification testing of microwave devices such as high-frequency resistance and capacitance, passive devices, RF front-end devices/modules, TR and other microwave devices under three-temperature conditions, to meet the real-time accurate testing and screening of microwave devices to be tested from automated electrical performance indicators.
The equipment is mainly composed of hander machine, ATE test module and three-temperature environmental test chamber. The Handler machine is built into the three-temperature environment test box, which meets the functions of automatic taking and discharging, position correction, sorting and swinging of the chip to be tested from the customized Tray plate under the three-temperature condition. Finally, it cooperates with vector network analyzer, impedance analyzer, high and low temperature signal extraction fixture and radio frequency link device to realize the automatic test operation of the whole system under the unified support of ATE software platform.
· Support the whole process automatic test function, and the interface real-time feedback working status and alarm information
· Support a variety of products quickly switch, and easy to operate
· Support unlimited expansion of subsequent product categories
· Support flexible configuration software TPS to meet different test process switching, supplement
· Support high and low temperature state pin forward and reverse identification
· Support automatic test data collection, storage, MES/cloud upload
· Support high-precision deembedding to ensure the accuracy of test data
Equipment Specifications
Microwave device three-temperature sorting test equipment
The equipment is mainly aimed at the production, research and development of small batch and measurement certification testing of microwave devices such as high-frequency resistance and capacitance, passive devices, RF front-end devices/modules, TR and other microwave devices under three-temperature conditions, to meet the real-time accurate testing and screening of microwave devices to be tested from automated electrical performance indicators.
The equipment is mainly composed of hander machine, ATE test module and three-temperature environmental test chamber. The Handler machine is built into the three-temperature environment test box, which meets the functions of automatic taking and discharging, position correction, sorting and swinging of the chip to be tested from the customized Tray plate under the three-temperature condition. Finally, it cooperates with vector network analyzer, impedance analyzer, high and low temperature signal extraction fixture and radio frequency link device to realize the automatic test operation of the whole system under the unified support of ATE software platform.
· Support the whole process automatic test function, and the interface real-time feedback working status and alarm information
· Support a variety of products quickly switch, and easy to operate
· Support unlimited expansion of subsequent product categories
· Support flexible configuration software TPS to meet different test process switching, supplement
· Support high and low temperature state pin forward and reverse identification
· Support automatic test data collection, storage, MES/cloud upload
· Support high-precision deembedding to ensure the accuracy of test data
Equipment Specifications
|
Specification Item |
Design Specifications |
|
Overall dimension |
＜2000*1600*2100mm |
|
Encapsulation form |
SOP/QFN/QFP/LGA/BGA/CSP等； |
|
Package size |
2 × 2 to 40 × 40mm |
|
Temperature range |
-60 ℃ ~ 150 ℃ ± 2 ℃ |
|
heating rate |
(20 ℃ ~ 150 ℃) within 40min (non-linear without load) |
|
cooling rate |
(20 ℃ ~-60 ℃) within 50min (nonlinear without load) |
|
Test efficiency |
UPH>200pcs (no load) |
|
Form of incoming and outgoing materials |
Tray To Tray |
|
Change time |
<1h;(including configuration software, replacement of fixtures, replacement of instruments to achieve different packages or types of chips) |
|
Reliability |
|
|
Data Management |
Automatically collect, save, analyze, count and export the original test data, and support the generation of data files in excel and word formats. |
|
Calibration |
The system automatic calibration function is realized by software, the calibration data and configuration parameters are automatically recorded, and the calibration configuration parameters are not lost after restarting the system. |
|
Test station |
Single/double station |
|
Equipment power supply |
AC220V 50Hz |
|
Equipment air source |
0.5～0.7Mpa |
|
Communication Interface |
RS232、GPIB、LAN、TTL |
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Address: Floor 10, Building 17, District 18, Fengtai District Headquarters Base, Beijing
Zip Code: 100070
Telephone:010-63718360
Email:sales@aumiwalker.com
Company website:www.aumiwalker.com
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